• Optical characterisation techniques
• Ellipsometry
• Photo luminescense
• Electron microscopy
• Electron beam writing
• Thin film deposition
• Reactive ion etching
• Fucused ion beam lithography
• Atomic force microscopy
• Apply basic experimental techniques for geometrical
characterisation of nanostructures
• Synthesise and characterise thin film
• Produce surface structures using particle beam lithography
• Be able to design fabrication processes for nano-scale
components
• Be able to produce simple components
• Be able to analyse results and compare to basic limitations
This is a 5 ECTS course module and the work load is expected to be 150 hours for the student.
Name of exam | Synthesis and Characterisation (course module) |
Type of exam | Active participation and/or written assignment
Individual continuous evaluation based on exercises given through
the course. |
ECTS | 5 |
Assessment | Passed/Not Passed |
Type of grading | Internal examination |
Criteria of assessment | As stated in the Joint Programme Regulations.
http://www.engineering.aau.dk/uddannelse/Studieadministration/ |
Danish title | Syntese og karakterisering (kursusmodul) |
Module code | F-FYS-K3-8 |
Module type | Course |
Duration | 1 semester |
Semester | Autumn
|
ECTS | 5 |
Language of instruction | Danish and English |
Empty-place Scheme | Yes |
Location of the lecture | Campus Aalborg |
Responsible for the module |
Study Board | Study Board of Mathematics, Physics and Nanotechnology |
Department | Department of Mathematical Sciences |
Faculty | Faculty of Engineering and Science |